Instrumentation
Bruker D8 Quest with Photon 100 Detector
Applications:
- Crystallinity determination
- Structure determination and refinement
- Minerals
- Organics
- Organometallics
- Charge Density
- Phase Transitions
- Twins
- Measurements under non-ambient conditions
Radiation wavelength:
- Mo K-Alpha1 [Å] 0.71073
Non-ambient conditions:
- Low temperatures to 80 K
- High temperature up to 400 K.
- Intern nitrogen gas atmosphere
PANalytical Empyrean Series 2 XRD
Applications:
- Phase identification/quantification
- Crystallinity determination
- Structure determination and refinement
- In-situ crystallization analysis
- Measurements under non-ambient conditions
- Dimensional and structural characterization of nanomaterials, nanoparticle systems, nanocomposites and mesoporous materials.
- Analysis of semi-crystalline materials.
Radiation wavelength:
- Cu K-Alpha1 [Å] 1.54060, K-Alpha2 [Å] 1.54443, K-Beta [Å] 1.39225
- Mo K-Alpha1 [Å] 0.7093, K-Alpha2 [Å] 0.71359, K-Beta [Å] 0.63229
2theta ranges:
- Ambient and Non-ambient experiments: 0° to 165° 2θ.
Non-ambient conditions:
- Low vacuum atmosphere.
- Gas atmosphere up to 1000kpa.
- High temperature up to 1173K.
- Temperature slope 1K/min to 60K/min
SIEMENS D5000 X-Ray Diffractometer XRD
Applications
- Identification and characterization of powders, thin films, single crystals, polycrystalline and amorphous materials.
- Phase identification/quantification.
- Crystallinity determination.
- Structure determination and refinement.
- Measurements under non-ambient conditions
Radiation wavelength:
- Kristalloflex 760 X-ray Generator, Cu K-Alpha1 [Å] 1.54060, K-Alpha2 [Å] 1.54443, K-Beta [Å] 1.39225
Non-ambient conditions:
- High temperature Anton Paar HTK-10 up to 1600°C.